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MCLinc staff includes specialists are specialized in
electron microscopy. Five electron microscopes provide
MCLinc scientists with powerful tools for materials
analysis, corrosion studies, particulate speciation,
source profiling, forensic investigations, and a host of
additional applications.
The X-ray Photoelectron Spectrometer (XPS) provides
surface analysis at 20 to 40 Angstrom units depth. XPS
can be used for identification of compounds,
determination of oxidation states of constituents,
chemical speciation, and depth profiling.
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Three scanning electron microscopes (SEM) and one
transmission electron microscope (TEM) provide ultra
high-resolution microscopy (magnification to 1,000,000x)
to identify extremely small particles. All are equipped
with energy dispersive x-ray spectroscopy (EDS) to
provide elemental analysis.
The ESEM (environmental scanning electron microscope) is
a unique SEM instrument that allows the sample to be
subjected to low-pressure gas conditions (water vapor
and other gases) at pressures up to 15 torr. This
allows the observation of reactions between a substrate
or its corrosion products with water vapor or selected
gases. |
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Materials and Chemistry
Laboratory, Inc.
East Tennessee Technology Park, Bldg. K-1006 • Oak Ridge, TN 37830-1702
Voice: (865) 576-4138 • FAX: (865) 576-8558
Contact:
Barry A. Stephenson, President
© Copyright 1999-2004 Materials and Chemistry Laboratory, Inc. All rights
reserved.
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