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Instrumentation and Resources

The MCLinc facility handles a wide range of sample types and is operated by a multidisciplinary staff qualified to address technical issues pertaining to virtually any process material. MCLinc's location at a federal facility helps to facilitate the access and utilization of other technical resources within the Oak Ridge/DOE complex.
 

Pictured above: Left - Inductively
Coupled Plasma Spectrometer (ICP),
Right - X-Ray Diffractor (XRD), and to
the immediate left is a high resolution Scanning Electron Microscope

• Alpha, Beta, Gamma Spectroscopy/Counting

• Atomic Absorption (AA)
• Digital Image Acquisition/Analysis
• Energy Dispersive X-Ray Spectroscopy (EDS)
• Environmental Scanning Electron Microscopy (ESEM)
• Explosion Test Systems
• Field Emission Scanning Electron Microscopy (FESEM)
• Fourier Transform Infrared Spectroscopy (FTIR)
• Gas Chromatography (GC)
• High Performance Liquid Chromatography (HPLC)
• Inductively Coupled Argon Plasma Spectroscopy (ICP)
• Ion Chromatography (IC)
• Optical Microscopy (OM)
• Phase Contrast Microscopy (PCM)
• Polarized Light Microscopy (PLM)
• Scanning Electron Microscopy (SEM)
• Scanning Transmission Electron Microscopy (STEM)
• Selective Area Electron Diffraction (SAED)
• Transmission Electron Microscopy (TEM)
• Ultraviolet/Visible Spectroscopy (UV/VIS)
• Wavelength Dispersive X-Rsay Spectroscopy (WDS)
• X-ray Diffraction (XRD)
• X-ray Fluorescence (XRF)
• X-ray Photoelectron Spectroscopy (XPS)

Transmission Electron Microscope